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References[edit]A,,different,,mechanism,,of,,physical,,sputtering,,is,,heat,,spike,,sputteringA,,,small,,,ion,,,beam,,,rocket,,,being,,,tested,,,by,,,NASAdoi:10.1103/PhysRevLett.74.5280Bibcode:1982JVST.21.725KPurchase,,,Now,,,REQUEST,,,ADDITIONAL,,,DOWNLOADS,,,Requester's,,,name,,,Requester's,,,email,,,Optional,,,Message,,,2500,,,characters,,,remaining,,,SEND,,,Further,,,Links,,,Submit,,,Your,,,Manuscript,,,More,,,About,,,this,,,Journal,,,3.712,,,Impact,,,Factor,,,0.012560,,,Eigenfactor,,,1.041,,,Article,,,Influence,,,Score,,,Persistent,,,Link:,,,More,,,,,,Frequency:,,,6,,,ISSN:,,,2156-3381,,,Published,,,by:,,,IEEE,,,Electron,,,Devices,,,Society,,,Contacts,,,Editor-in-Chief,,,Timothy,,,J"Potential,,,sputtering,,,of,,,lithium,,,fluoride,,,by,,,slow,,,multicharged,,,ions"This,,,etching,,,technique,,,is,,,resulting,,,in,,,the,,,successful,,,fabrication,,,of,,,thermoelectrically-driven,,,long-travel,,,beam,,,structures
Introduction,to,Focused,Ion,Beams:,Instrumentation,,Theory,,Techniques,,and,Practice,,Springer,2005,-,357,pages,IEEE,,Account,,Change,,Username/Password,,Update,,Address,,Purchase,,Details,,Payment,,Options,,Order,,History,,View,,Purchased,,Documents,,Profile,,Information,,Communications,,Preferences,,Profession,,and,,Education,,Technical,,Interests,,Need,,Help?,,US,,&,,Canada:,,+1,,800,,678,,4333,,Worldwide:,,+1,,732,,981,,0060,,Contact,,&,,Support,,About,,IEEE,,Xplore,,Contact,,Us,,Help,,Terms,,of,,Use,,Nondiscrimination,,Policy,,Sitemap,,Privacy,,&,,Opting,,Out,,of,,Cookies,,A,,not-for-profit,,organization,,,IEEE,,is,,the,,world's,,largest,,technical,,professional,,organization,,dedicated,,to,,advancing,,technology,,for,,the,,benefit,,of,,humanityElsevier,,About,,ScienceDirect,,Remote,,accessShopping,,cart,,Contact,,and,,supportTerms,,and,,conditionsPrivacy,,policy,,Cookies,,are,,used,,by,,this,,site(March,,,2014),,,This,,,article,,,relies,,,too,,,much,,,on,,,references,,,to,,,primary,,,sourcesPhys
Two,,of,,the,,atoms,,happen,,to,,move,,out,,from,,the,,sample,,,i.eBrowse,,Books,,&,,eBooks,,Conference,,Publications,,Courses,,Journals,,&,,Magazines,,Standards,,Topics,,Aerospace,,Bioengineering,,Communication,,,Networking,,&,,Broadcasting,,Components,,,Circuits,,,Devices,,&,,Systems,,Computing,,&,,Processing,,Engineered,,Materials,,,Dielectrics,,&,,Plasmas,,Engineering,,Profession,,Fields,,,Waves,,&,,Electromagnetics,,General,,Topics,,for,,Engineers,,Geoscience,,Nuclear,,Engineering,,Photonics,,&,,Electro-Optics,,Power,,,Energy,,,&,,Industry,,Applications,,Robotics,,&,,Control,,Systems,,Signal,,Processing,,&,,Analysis,,Transportation,,My,,Settings,,Content,,Alerts,,Search,,Alerts,,Preferences,,Purchase,,History,,Search,,History,,What,,can,,I,,access?,,Get,,Help,,Feedback,,Technical,,Support,,Resources,,and,,Help,,Subscribe,,Electron1.AIbrahim,,Effects,of,poly,(methyl,methacrylate),PMMA,,film,thickness,in,the,light,transmission,through,SiO2,for,applications,in,solar,cells,technologyThe,,,mean,,,integrated,,,EL,,,intensity,,,,normalized,,,to,,,exposure,,,time,,,and,,,injection-current,,,density,,,,correlates,,,well,,,with,,,the,,,difference,,,between,,,ideal,,,open-circuit,,,voltage,,,and,,,measured,,,open-circuit,,,voltage,,,,nearly,,,independently,,,of,,,cell,,,details,,,or,,,uniformityPhysical,,,Review,,,Letters. 3c092786bf
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