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Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories (Prentice Hall Modern Semiconductor Design Series)
by Kanad Chakraborty
rating: 5.0 (1 reviews)
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Surveys the latest research and field-proven techniques for every form of memory fault tolerance, including manufacturing, online, and field-related fault tolerance. Authors focus on practical circui
Details:
Amazon rank: #5,217,285
Price: $4.99
Publisher: Prentice Hall PTR (June 10, 2002)
Language: English
ISBN-10: 0130084654
ISBN-13: 978-0130084651
Weight: 1.8 pounds
Fault-Tolerance And Reliability Techniques For High-Density Random-Access Memories (Prentice Hall Modern Semiconductor Design Series) Mobi Download Book
Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories (Prentice Hall Modern Semiconductor Design Series) Kanad Chakraborty
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